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Автор: Ramachandran Saravanan
Издательство: LAP Lambert Academic Publishing
Описание: There are many techniques that can help evolving the minute details in the spintronics materials, but X- ray diffraction technique can give fine details of these materials in the form of charge density picture and local structure. Charge density results can be analyzed qualitatively and quantitatively for the type of bonding and also for the magnetic behavior involved. Hence, a study on these materials using experimental X-ray diffraction information is inevitable for the better understanding of local structure and magnetism. This monograph deals with the technologically important diluted magnetic semiconductors (DMS), zinc oxide based diluted magnetic semiconductors and manganites (LSMO) for their local and average structures, charge density etc.